US PATENT SUBCLASS 205 / 335
.~ Involving measuring, analyzing, or testing during synthesis

Current as of: June, 1999
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205 /   HD   ELECTROLYSIS: PROCESSES, COMPOSITIONS USED THEREIN, AND METHODS OF PREPARING THE COMPOSITIONS

334  DF  ELECTROLYTIC SYNTHESIS (PROCESS, COMPOSITION, AND METHOD OF PREPARING COMPOSITION) {21}
335.~ Involving measuring, analyzing, or testing during synthesis {2}
336  DF  .~.~> Utilizing fused bath (e.g., eliminating anode effect in a fused bath, etc.)
337  DF  .~.~> Current, current density, or voltage

DEFINITION

Classification: 205/335

Involving measuring, analyzing, or testing during synthesis:

(under subclass 334) Subject matter wherein the process includes a step of measuring, analyzing, or testing during synthesis.