US PATENT SUBCLASS 72 / 9.4
.~.~.~.~.~.~ Sensor utilizes radiation to detect thickness (e.g., by X-ray)

Current as of: June, 1999
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72 /   HD   METAL DEFORMING

6.1  DF  WITH USE OF CONTROL MEANS ENERGIZED IN RESPONSE TO ACTIVATOR STIMULATED BY CONDITION SENSOR {7}
6.2  DF  .~ Metal deforming by use of roller or roller-like tool element {8}
8.1  DF  .~.~ Including plural sensors or sensor responsive to comparison between plural conditions {3}
8.3  DF  .~.~.~ Sensing work or product (e.g., by X-ray) {6}
8.9  DF  .~.~.~.~ Sensing cross sectional dimension {2}
9.2  DF  .~.~.~.~.~ Sensing thickness {2}
9.4.~.~.~.~.~.~ Sensor utilizes radiation to detect thickness (e.g., by X-ray)

DEFINITION

Classification: 72/9.4

Sensor utilizes radiation to detect thickness (e.g., by X-ray):

(under subclass 9.2) Subject matter including use of a source of radiation and a detector responsive to that radiation to determines the extent of the lesser dimension by the amount of radiation reaching the detector.