US PATENT SUBCLASS 439 / 482
.~.~ Test probe


Current as of: June, 1999
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439 /   HD   ELECTRICAL CONNECTORS

476.1  DF  INCLUDING HANDLE OR DISTINCT MANIPULATING MEANS {4}
481  DF  .~ Randomly manipulated implement {1}
482.~.~ Test probe


DEFINITION

Classification: 439/482

Test probe:

(under subclass 481) Electrical connector comprising a generally rodlike member having an elongated portion adapted to be grasped by the hand of an operative for random manipulation thereof and having a contact* extending from the axial extremity thereof.

(1) Note. The contact may comprise a coupling part* for interfitting with a particular mating part*

SEE OR SEARCH THIS CLASS, SUBCLASS:

169, for a convertible test probe.

219, for a test probe convertible by internal change to selectively cooperate with a different contact.