US PATENT SUBCLASS 434 / 364
.~.~ With apertured overlay

Current as of: June, 1999
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434 /   HD   EDUCATION AND DEMONSTRATION

322  DF  QUESTION OR PROBLEM ELICITING RESPONSE {8}
363  DF  .~ Card or sheet for receiving examinee's written, marked, or punched response {1}
364.~.~ With apertured overlay

DEFINITION

Classification: 434/364

With apertured overlay:

(under subclass 363) Subject matter including a template having openings at positions corresponding to possible examinee responses to better enable an examinee to accurately locate a response by placing a marking instrument through a selected opening in the overlay.

SEE OR SEARCH CLASS

33, Geometrical Instruments,

174, for templates, per se.