US PATENT SUBCLASS 434 / 364
.~.~ With apertured overlay


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



434 /   HD   EDUCATION AND DEMONSTRATION

322  DF  QUESTION OR PROBLEM ELICITING RESPONSE {8}
363  DF  .~ Card or sheet for receiving examinee's written, marked, or punched response {1}
364.~.~ With apertured overlay


DEFINITION

Classification: 434/364

With apertured overlay:

(under subclass 363) Subject matter including a template having openings at positions corresponding to possible examinee responses to better enable an examinee to accurately locate a response by placing a marking instrument through a selected opening in the overlay.

SEE OR SEARCH CLASS

33, Geometrical Instruments,

174, for templates, per se.