US PATENT SUBCLASS 378 / 58
.~.~ Flaw analysis

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
51  DF  .~ Absorption {7}
58.~.~ Flaw analysis {2}
59  DF  .~.~.~> Pipe testing {1}
61  DF  .~.~.~> Tire testing

DEFINITION

Classification: 378/58

Flaw analysis:

(under subclass 51) Subject matter including detection and location of a structural defect in an object under examination by analyzing the pattern of absorption of X-rays passing through the object in comparison with pattern of absorption of X-rays passing through a reference object of known integrity.

SEE OR SEARCH THIS CLASS, SUBCLASS:

86, for scatter type flaw analysis.