US PATENT SUBCLASS 378 / 53
.~.~ Composition analysis


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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
51  DF  .~ Absorption {7}
53.~.~ Composition analysis


DEFINITION

Classification: 378/53

Composition analysis:

(under subclass 51) Subject matter including measurement of the chemical composition, quantity (density), or presence of a specific substance in an analyte.

(1) Note. The measurement is typically accomplished by energy analysis of the X-ray spectra as absorbed by the analyte and comparing the absorbed spectra with reference a spectra from substances of known composition. The energy of specific line absorptions uniquely identifies chemical elements and the degree of the absorption characterizes its quantity.

SEE OR SEARCH THIS CLASS, SUBCLASS:

45, for fluorescence composition analysis.

83, and 88, for diffraction, reflection, or scatter composition analysis.