US PATENT SUBCLASS 378 / 50
.~.~ Thickness or density analysis

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
44  DF  .~ Fluorescence {2}
50.~.~ Thickness or density analysis

DEFINITION

Classification: 378/50

Thickness or density analysis:

(under subclass 44) Subject matter including measurement of the thickness or density of an object such as a sheet or coating.

(1) Note. This measurement is typically accomplished by comparing the attenuation of fluorescent X-rays generated within the object with the attenuation in a reference object of known thickness or density.

SEE OR SEARCH THIS CLASS, SUBCLASS:

54+, for absorption type thickness or density analysis.

89+, for scattering type thickness or density analysis.

SEE OR SEARCH CLASS

73, Measuring and Testing,

152.05+, for measuring density within a borehole.