US PATENT SUBCLASS 378 / 45
.~.~ Composition analysis

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
44  DF  .~ Fluorescence {2}
45.~.~ Composition analysis {4}
46  DF  .~.~.~> Plural diverse X-ray analyses
47  DF  .~.~.~> Fluid analyte
48  DF  .~.~.~> With standardization
49  DF  .~.~.~> With spatially dispersive energy analysis

DEFINITION

Classification: 378/45

Composition analysis:

(under subclass 44) Subject matter including measurement of the chemical composition, quantity (density), or presence of a specific substance in an analyte.

(1) Note. The measurement is typically accomplished by energy analysis of the fluorescent X-rays emitted by the object under examination. The energy of specific line emissions uniquely identifies chemical elements and the intensity of the emission characterizes its quantity.

SEE OR SEARCH THIS CLASS, SUBCLASS:

53, for absorption composition analysis.

83, and 88, for diffraction, reflection, or scattering composition analysis.

SEE OR SEARCH CLASS

23, Chemistry: Physical Processes, appropriate subclasses for chemical composition analysis.