US PATENT SUBCLASS 378 / 17
.~.~ Tiltable or nonvertical examination plane

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
4  DF  .~ Computerized tomography {13}
17.~.~ Tiltable or nonvertical examination plane

DEFINITION

Classification: 378/17

Tiltable or nonvertical examination plane:

(under subclass 4) Subject matter including means which allows the source or detector to be positioned such that the cross section being imaged is in some other than the more usual vertical plane.