US PATENT SUBCLASS 378 / 113
.~.~ Electron beam control


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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

91  DF  ELECTRONIC CIRCUIT {7}
101  DF  .~ X-ray source power supply {10}
113.~.~ Electron beam control


DEFINITION

Classification: 378/113

Electron beam control:

(under subclass 101) Subject matter including supplying appropriate voltages and current to a source to control the focus or intensity or to cause scanning or deflection of the X-ray producing electron beam therein.

SEE OR SEARCH THIS CLASS, SUBCLASS:

12, for tomography systems which include electronic scanning.

137, for X-ray tubes, per se, which include electron scanning or deflecting means.

138, for X-ray tubes, per se, which include electron focusing or intensity control means.

146, and 193, for mechanical X-ray scanning.

SEE OR SEARCH CLASS

315, Electric Lamp and Discharge Devices: Systems, 364+, for non-X-ray cathode-ray tube deflection circuits.