US PATENT SUBCLASS 374 / 12
.~ Detail of sample holder or support therefor

Current as of: June, 1999
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374 /   HD   THERMAL MEASURING AND TESTING

10  DF  DIFFERENTIAL THERMAL ANALYSIS {2}
12.~ Detail of sample holder or support therefor {1}
13  DF  .~.~> Formed by thermoelectric element

DEFINITION

Classification: 374/12

Detail of sample holder or support therefor:

(under subclass 10) Subject matter including structural detail of a specimen holder or of a holder supporting arrangement.

SEE OR SEARCH THIS CLASS, SUBCLASS:

208, for such a holder or support, per se.