US PATENT SUBCLASS 33 / 831
.~.~.~ Details (e.g., spindle or anvil adjustment, material

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

700  DF  DISTANCE MEASURING {13}
783  DF  .~ Opposed contacts {10}
813  DF  .~.~ Micrometer {10}
831.~.~.~ Details (e.g., spindle or anvil adjustment, material

DEFINITION

Classification: 33/831

Details (e.g., spindle or anvil adjustment, material):

(under subclass 813) Subject matter which is directed to a detail of a specific element of the micrometer.

(1) Note. If the improvement is a subcombination which is not classified elsewhere, such improvement may be included in this subclass.