US PATENT SUBCLASS 33 / 645
.~.~ Alignment
Current as of: June, 1999
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DEFINITION
Classification: 33/645
Alignment:
(under subclass 613) Subject matter wherein the gauge contacts a first and second object, or a first part and a second part of one object to assist in the positioning of the
two in or on a straight line.
SEE OR SEARCH THIS CLASS, SUBCLASS:
520, for gauges for centering or locating a point on a single object.
644, for gauges for centering a first part with respect to a second part or for locating a point on the first part with respect to a point on the second part.