US PATENT SUBCLASS 33 / 572
.~ Probe support


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
572.~ Probe support


DEFINITION

Classification: 33/572

Probe support:

(under subclass 501) Subject matter which includes a support, per se, for a contact member not provided for elsewhere.

SEE OR SEARCH THIS CLASS, SUBCLASS:

537, for a movably supported sine, cosine or tangent bar.

549+, for a movably supported contact member gauge with or without an indicator responsive to the member and an article support with the gauge.

556+, for movably supported contact member with or without an indicator responsive to the member.

562, for a template and its support.

568+, for a movably supported contact member work support to accurately position the member angularly or linearly.