US PATENT SUBCLASS 33 / 572
.~ Probe support
Current as of: June, 1999
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DEFINITION
Classification: 33/572
Probe support:
(under subclass 501) Subject matter which includes a support, per se, for a contact member not provided for elsewhere.
SEE OR SEARCH THIS CLASS, SUBCLASS:
537, for a movably supported sine, cosine or tangent bar.
549+, for a movably supported contact member gauge with or without an indicator responsive to the member and an article support with the gauge.
556+, for movably supported contact member with or without an indicator responsive to the member.
562, for a template and its support.
568+, for a movably supported contact member work support to accurately position the member angularly or linearly.
