US PATENT SUBCLASS 33 / 558.4
.~.~ Pivoted probe

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
558.01  DF  .~ Pivoted probes (e.g., divider, caliper, etc.) {7}
558.4.~.~ Pivoted probe

DEFINITION

Classification: 33/558.4

Pivoted probe:

(under subclass 558.01) Subject matter wherein the contact member is movable about a point with respect to an element holding it.