US PATENT SUBCLASS 33 / 501.09
.~.~.~ Plural contact probes


Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
501.05  DF  .~ Comparator {3}
501.08  DF  .~.~ Hand held {2}
501.09.~.~.~ Plural contact probes {4}
501.1  DF  .~.~.~.~> Only three probes {1}
501.3  DF  .~.~.~.~> Only four probes
501.4  DF  .~.~.~.~> With rotary indicator
501.45  DF  .~.~.~.~> Fixed size


DEFINITION

Classification: 33/501.09

Plural contact probes:

(under subclass 501.08) Subject matter having more than one contact member.