US PATENT SUBCLASS 33 / 501.04
.~.~.~ Pivoted probe

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
501.02  DF  .~ Continuous gauging {1}
501.03  DF  .~.~ Including electric means {1}
501.04.~.~.~ Pivoted probe

DEFINITION

Classification: 33/501.04

Pivoted probe:

(under subclass 501.03) Subject matter wherein the contact member is movable about a point.