US PATENT SUBCLASS 33 / 17 A
.~.~ Pattern grading


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



33 /   HD   GEOMETRICAL INSTRUMENTS

2 R  DF  APPAREL {7}
17 R  DF  .~ Processes {1}
17 A.~.~ Pattern grading

Unofficial Alpha Subclasses: R A

DEFINITION

Classification: 33/17

(under subclass 2) Subject matter comprising methods employed in taking measurements for and laying out apparel.

SEE OR SEARCH THIS CLASS, SUBCLASS:

6, for analogous methods involving footwear.