US PATENT SUBCLASS 250 / 559.12
.~.~ Beam interruption or shadow

Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

200  DF  PHOTOCELLS; CIRCUITS AND APPARATUS {11}
559.01  DF  .~ With circuit for evaluating a web, strand, strip, or sheet {13}
559.12.~.~ Beam interruption or shadow {3}
559.13  DF  .~.~.~> With laser source
559.14  DF  .~.~.~> With rotation of material
559.15  DF  .~.~.~> With plural detectors

DEFINITION

Classification: 250/559.12

Beam interruption or shadow:

(under subclass 559.01) Subject matter wherein some characteristic of an opaque material is determined by measuring the proportion of the amount of light detected by a photocell (when the opaque material is placed in the light path between the photocell and a light source) to the amount of light detected by the photocell from the source in the complete absence of the opaque material.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing,

386+, for measuring a moving object by light interruption.