US PATENT SUBCLASS 250 / 396 R
WITH CHARGED PARTICLE BEAM DEFLECTION OR FOCUSSING


Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

396 RWITH CHARGED PARTICLE BEAM DEFLECTION OR FOCUSSING {3}
397  DF  .~> With detector
398  DF  .~> With target means {2}
396 ML  DF  .~> Magnetic lens

Unofficial Alpha Subclasses: R ML

DEFINITION

Classification: 250/396

(under the class definition) Subject matter having means to deflect, scan, spread or focus a beam of electrons or ions.

(1) Note. The subject matter of this subclass and the subclasses indented hereunder is often referred to as "electro-optical means" because its effect on electronic or ionic beams is similar to the effects of lenses or prisms on light beams.

(2) Note. Beam forming means, per se, or electron or ion accelerating means, per se, are not classified here even though they may be recited as focusing means since the definition of this subclass presupposes a beam already formed.

SEE OR SEARCH THIS CLASS, SUBCLASS:

423+, for ion generators with focusing means not of the beam lens type.

SEE OR SEARCH CLASS

335, Electricity: Magnetically Operated Switches, Magnets, and Electromagnets, 210, for ion or electron beam deflecting magnets, per se, and the Search Notes thereto for combinations including such magnet means.