(under subclass 390.01) Subject matter in combination with means to determine the constituents of an object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
269.4, for composition analysis of a formation surrounding a bore-hole using a source.
370.03, for semiconductor detectors of fission fragment or fissionable isotopes.
SEE OR SEARCH CLASS
376, Induced Nuclear Reactions: Processes, Systems, and Elements,
159, for neutron activation analysis. 378, X-Ray or Gamma Ray Systems or Devices,
45+, for composition analysis using fluorescence, subclass 53 for composition analysis using absorption, and subclass 83 for composition analysis using spatial energy dispersion.