US PATENT SUBCLASS 250 / 341.8
.~.~.~.~ Measuring infrared radiation reflected from sample

Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

336.1  DF  INVISIBLE RADIANT ENERGY RESPONSIVE ELECTRIC SIGNALLING {16}
338.1  DF  .~ Infrared responsive {12}
340  DF  .~.~ Methods {2}
341.1  DF  .~.~.~ With irradiation or heating of object or material {7}
341.8.~.~.~.~ Measuring infrared radiation reflected from sample

DEFINITION

Classification: 250/341.8

Measuring infrared radiation reflected from sample:

(under subclass 341.1) Subject matter wherein detection means are positioned to receive infrared radiation which has been

reflected by the material or object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

339.11, for measuring infrared radiation reflected from samples with selection of plural discrete wavelengths or bands.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing,

445+, for light reflection systems in general.