(under subclass 294) Subject matter including in addition to a first type static field ion selecting means, another static field of a different type ion path bending means which may be for the purpose of selecting ions of one charge-to-mass ration from ions of another charge-to-mass ratio or for some other purpose such as accelerating or focusing the ions.
(1) Note. The plural diverse types of field means of the subject matter of this subclass are generally magnetic and electro static.
SEE OR SEARCH THIS CLASS, SUBCLASS:
396+, for electrical beam focusing means, per se, and in combination with ion sources or detectors.
