US PATENT SUBCLASS 234 / 67
.~ With means to modify effect of pattern data

Current as of: June, 1999
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234 /   HD   SELECTIVE CUTTING (E.G., PUNCHING)

59  DF  WITH MEANS TO INITIATE TOOL SELECTION BY SENSING PATTERN INDICIA OR CONFIGURED MACHINE ELEMENT {11}
67.~ With means to modify effect of pattern data {4}
68  DF  .~.~> By inversion of pattern data
69  DF  .~.~> Code conversion {1}
71  DF  .~.~> Means for timing the tool actuation
72  DF  .~.~> Means for transposition, shift or suppression of field {1}

DEFINITION

Classification: 234/67

(under subclass 59) Device provided with means to effect significant alteration, in any one cutting cycle, of the relative positions of the selected cutting tool pairs with respect to the positions of corresponding control indicia or characteristics in the pattern.

(1) Note. The general effect produced by a device of this

type is to make a product which has cut or punched portions, not all of which correspond in spatial position or arrangement to their related pattern indicia.

(2) Note. Included here are some patents which claim such arrangements of tools, control means, and/or pattern sensers as to enable the use of smaller, cheaper, or more simplified mechanisms than could be achieved with the use of "facsimile" patterns.

(3) Note. Included in this and indented subclasses are, for example, disclosures of means to effect one or more of the following functions: to produce a combinational-code*, to decode such a code into a single cutting operation, to convert from one code to another, to produce a complementary or "inverse" duplicate of a field of perforations, to reproduce only selected fields of a pattern, or to shift the relative positions of data being reproduced.

SEE OR SEARCH THIS CLASS, SUBCLASS:

3, for a method comprising the step of modifying the effectiveness of a pattern. 29, and 43, for other instances of modified reproduction of pattern data.

65, for joint control of tool selection by a pattern reader and other means, which control may modify the effect of the pattern data.