US PATENT SUBCLASS 205 / 81
.~ Involving measuring, analyzing, or testing

Current as of: June, 1999
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205 /   HD   ELECTROLYSIS: PROCESSES, COMPOSITIONS USED THEREIN, AND METHODS OF PREPARING THE COMPOSITIONS

80  DF  ELECTROLYTIC COATING (PROCESS, COMPOSITION AND METHOD OF PREPARING COMPOSITION) {42}
81.~ Involving measuring, analyzing, or testing {1}
82  DF  .~.~> Controlling coating process in response to measured or detected parameter {2}

DEFINITION

Classification: 205/81

Involving measuring, analyzing, or testing:

(under subclass 80) Subject matter wherein the process includes a step of measuring, analyzing, or testing.