US PATENT SUBCLASS 205 / 791.5
.~.~ Defects

Current as of: June, 1999
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205 /   HD   ELECTROLYSIS: PROCESSES, COMPOSITIONS USED THEREIN, AND METHODS OF PREPARING THE COMPOSITIONS

775  DF  ELECTROLYTIC ANALYSIS OR TESTING (PROCESS AND ELECTROLYTE COMPOSITION) {19}
790.5  DF  .~ For properties of solid material (e.g., surface area, etc.) {2}
791.5.~.~ Defects

DEFINITION

Classification: 205/791.5

Defects:

(under subclass 790.5) Subject matter which involves detecting undesirable localized variations in a solid material or component (e.g., localized microstructure defects in a solid metal article which may result in mechanical or electrical failure, etc.).

SEE OR SEARCH CLASS

204, Chemistry: Electrical and Wave Energy,

401, for electrolytic apparatus for analysis and testing having means for fault testing of a sensor or component used therein.