US PATENT SUBCLASS 204 / 401
.~.~.~ Fault testing of sensor or component

Current as of: June, 1999
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204 /   HD   CHEMISTRY: ELECTRICAL AND WAVE ENERGY

193  DF  APPARATUS {5}
194  DF  .~ Electrolytic {11}
400  DF  .~.~ Analysis and testing {20}
401.~.~.~ Fault testing of sensor or component

DEFINITION

Classification: 204/401

Fault testing of sensor or component:

(under subclass 400) Apparatus including means for detecting the nonoperative condition of the electrochemical testing device or apparatus associated with it.