US PATENT SUBCLASS 117 / 14
.~.~ With a step of measuring, testing, or sensing (e.g., using TV, photo, or X-ray detector or weight changes)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


117 /   HD   SINGLE-CRYSTAL, ORIENTED-CRYSTAL, AND EPITAXY GROWTH PROCESSES; NON-COATING APPARATUS THEREFOR

11  DF  PROCESSES OF GROWTH FROM LIQUID OR SUPERCRITICAL STATE {7}
13  DF  .~ Having pulling during growth (e.g., Czochralski method, zone drawing) {9}
14.~.~ With a step of measuring, testing, or sensing (e.g., using TV, photo, or X-ray detector or weight changes) {1}
15  DF  .~.~.~> With responsive control {1}

DEFINITION

Classification: 117/14

With a step of measuring, testing, or sensing (e.g., using TV, photo, or X-ray detector or weight changes):

(under subclass 13) Subject matter which includes the measuring, testing, or sensing of a process condition or parameter during the process.

(1) Note. Since all processes involve control of process parameters, placement here requires more than merely a statement of controlling or operating at a certain set of conditions. Thus, not included are mere recitations of "controlling" or "maintaining." Further, merely reciting a program or cycle or time control is not sufficient for placement here.

(2) Note. Equivalent terms include examining, inspecting, observing, viewing, and monitoring.